Advantest’s New High-Speed T5851 Semiconductor Memory Tester Provides Versatile, Low-Cost Solution

Tester Enables System-Level Testing of High-Performance Universal Flash Storage and PCIe BGA SSDs for the Rapidly Growing Mobile Electronics Market

 Munich, Germany, 07.12.2015 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) – memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops.

The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest’s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.

Built with the same proven test architecture used in Advantest’s MPT3000 family of SSD test solutions, the T5851 allows customers to minimize both their capital investments and deployment risks by using the same versatile platform and FutureSuite™ software as other members of the T5800 product line. Configuration and performance can be optimized for any DUTs and the system’s modular upgradeability enhances customers’ ROI well into the future.

The system’s scalable, high-current programmable power supplies (PPSs) support all current and next-generation device needs. In addition, the robust module design and liquid-cooling capability give the T5851 superior reliability.

“Mobile electronics requiring low power consumption are driving demand for advanced storage solutions that employ high-speed, energy-efficient serial interfaces and high-performance storage protocols,” said Masuhiro Yamada, executive officer with Advantest. “Memory IC makers need a new class of tester that specializes in system-level testing of such devices, but still maintains the reliability, low-cost and high-volume characteristics required for conventional memory testers. Our new T5851 fills that need.”

Shipments of production systems are scheduled to begin in the first quarter of 2016.