LATEST NEWS

Imec world first to demonstrate 2 Metal layer back-end-of-line for the 3nm technology node

LEUVEN (Belgium), July 8, 2019 — This week, at its technology forum ITF USA 2019, imec, a world-leading research and innovation hub in nanoelectronics and digital technologies, presents a dual-damascene 21nm pitch test vehicle relevant for manufacturing the 3nm logic technology node. With this test vehicle, a 30 percent improvement in resistance-capacitance product (RC) was obtained compared to previous generations, without impacting reliability. The need for implementing scaling boosters such as self-aligned vias and self-aligned blocks in 3nm and beyond interconnect technologies has been demonstrated.

While the dimensional scaling of traditional front-end technologies is expected to slow down, the back-end-of-line dimensions keep on scaling with ~0.7X to keep up with the required area scaling. For the 3nm logic technology node, M2 interconnect layers with metal pitches as tight as 21nm need to be manufactured while preserving the back-end-of-line’s performance. This implies a tight control of the RC delay, while maintaining good reliability.

Imec for the first time demonstrated a dual-damascene 21nm metal pitch test vehicle that is relevant for the 3nm technology node. The measured RC shows a 30 percent improvement compared to previous generations. The test vehicle also performs well in terms of reliability: no electromigration failures were observed after 530 hours at 330°C, and dielectric breakdown (TDDB) measurements demonstrated a time-to-failure >10 years at 100°C.

To pattern the M2 layer, a hybrid lithography approach was proposed, using 193nm immersion-based self-aligned quadrupole patterning (SAQP) for printing the lines and trenches, and extreme ultraviolet lithography (EUVL) for printing the block and via structures. The test vehicle implemented a barrier-less ruthenium (Ru) metallization scheme and an insulator with dielectric constant k = 3.0.

First results also demonstrate that the proposed interconnect technology can be improved by adding scaling boosters, including buried power rail, SuperVia, self-aligned blocks, fully self-aligned vias and double self-aligned blocks.

Liat

Recent Posts

Microchip Technology Earns IEC 62443-4-1 ML2 Industrial Automation and Control System Certification From UL Solutions  

Secure Development Processes Advance CRA Readiness and Increase Customer Cybersecurity Assurance CHANDLER, Ariz., April 2,…

1 week ago

AI Won’t Replace You. But Ignoring It Might.

There is a lot of "SaaS is dead" or "AI is coming for your job"…

1 week ago

Melexis Enables Fast, Code-Free Three-Phase Fan Design with Intuitive Motor Driver

Tessenderlo-Ham, Belgium, 31 March 2026 – Melexis announces the MLX80339, a code-free three-phase fan driver…

1 week ago

Voltify Raises $30 Million Seed Round to Build the “Tesla of Rail” and Transform Rail Energy Infrastructure

Voltify, the startup pioneering a new approach to rail electrification, today announced it has raised…

1 week ago

Siemens joins ESA’s EPIC initiative to boost space startups across Europe

Siemens has signed a letter of intent with the European Space Agency to join its…

1 week ago

IDS launches Nion 3D ToF camera with 1.2 MP depth sensing for industrial automation

IDS Imaging Development Systems has introduced the Nion, a new industrial Time of Flight (ToF)…

1 week ago