Categories: NEW PRODUCTS

D/A Converter Offers More Accuracy in a Smaller Footprint for Diverse Applications Ranging from Radar to Smartphone Testing

Analog Devices, Inc. (ADI) today introduced the AD9164 D/A converter that brings high resolution radar images for designers of military and commercial radar while reducing solution component count. Additionally, for designers of precision instrumentation equipment, such as smartphone testers, the new device ensures improved accuracy as well as speed of test, contributing to faster market-ready time while significantly decreasing tester complexity and size. Thanks to its audio to 6 GHz frequency coverage, the AD9164 D/A converter moves the tester market one step closer to a universal wireless test platform.

The AD9164 D/A converter delivers:

    • Highest linearity in ADI’s D/A converters portfolio
    • 100 to 1,000 times improved spectral purity versus previous generation ADI solutions (20-30 dB better)
  • Higher agility with frequency change time now a 100 times shorter than traditional ADI phased locked loop (PLL) systems

The reduction in solution component count and thus size enables element level digital beamforming advanced radar solutions. With the same performance specifications as the already released AD9162, the AD9164 D/A converter also includes an on-chip direct digital synthesizer (DDS) that ensures phase-coherent fast frequency hopping of less than 300 ns for up to 32 different frequencies. This makes the AD9164 D/A converter well-suited for testing anything from AM broadcast band or Japanese FM band, to 5.8 GHz UNII band.

The AD9164 converter features a 2x interpolator (FIR85), which enables configurability for lower data rates and converter clocking to reduce overall system power and ease filtering requirements. In mix-mode operation, this D/A converter can be configured to reconstruct RF carriers in the 2nd and 3rd Nyquist zones up to 7.5 GHz while maintaining exceptional dynamic range.

The AD9164 also comes with a unique remote evaluation tool, allowing designers to “test-drive” the D/A converter’s performance. The remote tool is available at https://labs.analog.com/ad916x.

Liat

Recent Posts

Apiiro Launches AI-SAST That Detects, Validates and Fixes Code Vulnerabilities with Software Architectural Context from Code-to-Runtime

New capability combines AST scanning, LLM reasoning, and Apiiro Deep Code Analysis (DCA) to deliver…

5 hours ago

Avnet ASIC and Bar-Ilan University Launch Innovation Center for Next Generation Chiplets

Collaboration aims to accelerate Europe’s adoption of chiplets and advanced 2.5D and 3D chip packaging…

5 days ago

NVIDIA Acquires Open-Source Workload Management Provider SchedMD

NVIDIA will continue to distribute SchedMD’s open-source, vendor-neutral Slurm software, ensuring wide availability for high-performance…

5 days ago

Stratasys Supercharges Airbus Production: More Than 25,000 Parts 3D-Printed this Year; 200,000+ Already in Flight

Powered by Stratasys (NASDAQ: SSYS) technology, Airbus is producing more than 25,000 flight-ready 3D-printed parts…

1 week ago

Quantum Art Raises $100 Million in Series A Round to Drive Scalable, Multi-Core Quantum Computing

Funding will support Quantum Art in reaching a 1,000-qubit commercial platform and global expansion Quantum…

1 week ago

Hud Ships First Runtime Code Sensor to Bring Production Reality to Code Generation

Hud automatically captures live service and function-level data from production- providing the missing context for…

1 week ago